We hereby propose a software solution to perform high quality electrical\nmeasurements for the characterization of WORM (write-once read many), a\nnew generation memory device which is being intensively studied for\nnon-volatile data storage. The as-proposed software is completely based\non .NET framework and sample C# code. The paper performed a relevant\nmeasurement based on this software. Working WORM devices, based on a\npolymeric matrix embedded with gold and copper sulfide nano particles, have\nbeen used for test measurements. The aim of this paper is to show the main\nsteps to develop a fully working measurement software without using any\nexpensive dedicated software.
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